Reliable Nonvolatile Memory Black Phosphorus Ferroelectric Field-Effect Transistors with van der Waals Buffer
Release time:2022-03-28
Hits:
DOI number:
10.1021/acsami.9b15457
Journal:
ACS Appl. Mater. Interfaces
Co-author:
Shili Yan, Hai Huang Zhijian Xie, Guojun Ye, Xiao-Xi Li, Takashi Taniguchi, Kenji Watanabe, Zheng Han, Xianhui Chen*, Jianlu Wang*, Jian-Hao Chen*
Document Code:
55
Volume:
11
Issue:
4
Page Number:
42358-42364
Translation or Not:
no
Date of Publication:
2019-10-21
