Reliable Nonvolatile Memory Black Phosphorus Ferroelectric Field-Effect Transistors with van der Waals Buffer
- DOI number:10.1021/acsami.9b15457
- Journal:ACS Appl. Mater. Interfaces
- Co-author:Shili Yan, Hai Huang Zhijian Xie, Guojun Ye, Xiao-Xi Li, Takashi Taniguchi, Kenji Watanabe, Zheng Han, Xianhui Chen*, Jianlu Wang*, Jian-Hao Chen*
- Document Code:55
- Volume:11
- Issue:4
- Page Number:42358-42364
- Translation or Not:no
- Date of Publication:2019/10/21
- Links to published journals:https://pubs.acs.org/doi/10.1021/acsami.9b15457
MOBILE Version